Ian Ward's email:
first name at this domain
wardi on OFTC, freenode and github
For pyrf I needed to take data from a frequency plot, which could be any number of points, and present it as a spectrogram that fills the view size exactly. In the spectrogram I only care about the maximum values that appear in the range of frequencies represented by each pixel.
If I could just divide the number of source bins by an integer factor the solution would be simple:
return np.amax(data.reshape((-1, factor)), axis=1)
But I have to be able to handle any number of source bins and output that to any number of pixels.
Fortunately numpy is awesome.
I've been working on two new CKAN extensions that I'm really excited about. Since I helped build the custom metadata schema for http://data.gc.ca/ I've never been completely satisfied with the approach we took. These new extensions are the start of a proper solution to the compromises we made.
The new extensions are:
I will be speaking about contributing to Open Source software by webcast at the Global IT Architect Association's E-Summit on Open Source on May 16 at 2pm ET. It's free to join, listen in and ask questions.
What does bar.foo do? - An exploration of Python assignment, objects, attributes and descriptors
This is a talk I gave March 27, 2014 at the Ottawa Python Authors Group meetup.
Follow along with the IPython notebook version if you would like to play with the code examples.
Urwid 1.2.0 is now available at http://urwid.org/ and on pypi. Lots of new features:
Urwid's home page has moved to http://urwid.org/
Source control, issue tracking and wiki pages are now hosted on github. The new home page and changelog are now generated by sphinx like the Urwid manual, tutorial and reference.
The bug-fix-only release Urwid 1.1.2 is now available at http://urwid.org/ and on pypi.
After working on PyRF this past year, I was asked to help edit to a paper written by ThinkRF's Nikhil Adnani for AUTOTESTCON 2013: Wideband 20 GHz RF Digitizer and Python-based Open Application Framework for Test and Measurement.
We were fortunate enough to win the Walter E. Peterson award for Best Paper on Technology, and while I missed the show I did receive a handsome plaque and certificate for my contribution.
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